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April 2010
Test and Measurement News
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What's New at Scope Central
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| Testing High-Speed Serial Data Buses |
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Staying a Step Ahead of DDR, DDR2 and DDR3 SDRAM Challenges |
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Today's embedded system applications call for memory devices that are denser, faster, lower-powered and physically small. DRAM technology has advanced to meet these demands, and it's your job to stay a step ahead. Our comprehensive application note shows you how to use the power of a logic analyzer to verify DDR SDRAM commands and protocols.
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The Right Oscilloscope Can Improve Your Design?s Performance |
Are your design measurements accurate? Repeatable? It's critically important to properly evaluate your scope's acquisition system performance. Our new webinar gives you the details on common sources of digitizer error and reveals how these sources affect measurements. You'll also learn about "effective bits" and how they're related to noise, bandwidth and jitter.
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Serial Buses-The Next Generation |
High-speed serial bus architectures are everywhere these days; you've probably dealt with first and second-generation standards like Serial ATA. But now the Third Generation has arrived and sure enough, there are challenging new measurement needs. Request our 28-page primer and learn the fine points of analog and digital measurements on emerging Third Gen technology.
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MOST FREQUENTLY DOWNLOADED APPLICATION NOTES |
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| Solving Embedded System Challenges |
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Webinar Covers Debugging Serial Buses in Embedded System Designs |
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Need a quick refresher on serial bus essentials? Our webinar discusses the transition from parallel to serial, provides an overview of widely used serial buses, highlights the new challenges they bring and offers insights into key serial measurements. Learn how to quickly and efficiently debug the serial buses in your latest embedded design.
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Try Out the Latest Tektronix Solutions at ESC Silicon Valley |
The tools of your trade-the latest oscilloscopes, signal generators, digital multimeters and logic analyzers from Tektronix-will be on display in Booth # 617 at the upcoming ESC Conference. Learn from our experts in the booth or in the conference's technical sessions. And for one-on-one demos, visit the Tektronix Mobile Expo just outside the Convention Center.
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Switch-Mode Power Supply Measurements Explained |
Digital systems depend on current from switch-mode power supplies whose performance depends in turn on how well you characterize values like switching loss, power quality, harmonics and more. Our webinar brings you up to speed on the basic-but required-measurements that validate your switch mode power supply design.
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MOST FREQUENTLY DOWNLOADED APPLICATION NOTES |
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| RF/Microwave Design and Test |
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Free Poster Takes A Global View of Spectrum Allocations |
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Few engineers can recite worldwide RF spectrum allocations from memory. For the rest of us, Tektronix' color-coded poster maps out every ITU regional allocation in clear graphical form. It also explains the benefits of Live RF and frequency-domain triggering in radio/satellite communication and spectrum management applications. Request your poster today!
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For RF Measurements, Efficiency and Automation Go Hand in Hand |
When dealing with RF pulse measurements, automation is often the most efficient way to get reliable, accurate results. The new "Fundamentals of Radar Measurements" webinar introduces key radar signal parameters and then drills into the details on automatic pulse measurements. See how automated tools can make a difference in your everyday RF work.
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Unleash the Power of Active Load-Pull Measurements for UHF Amps |
Seasoned designers know all about the physical and mechanical limitations of passive harmonic load-pull solutions for UHF amplifier measurements. Is there a better way? Yes! Our new webinar highlights active load-pull methods and looks into nonlinear measurement issues. See how these latest innovations make a difference.
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MOST FREQUENTLY DOWNLOADED APPLICATION NOTES |
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See How MPEG Timing and Synchronization Affect Video Quality |
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If you're designing, evaluating or integrating Encoders and Set Top Boxes, you want to deal with timing concerns before they impact end users. Our webinar covering Program Clock Reference (PCR) and related issues explains timing principles and their effect on video quality. See how a Tektronix Buffer Analyzer pinpoints the source of timing problems!
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Objective Measurements Match Subjective Impressions |
If you've had to trade off some picture quality for manufacturing cost, network bandwidth or down-conversion algorithms, can you measure the impact on perceived picture quality? Automated objective measurements can reliably take the place of subjective "Golden Eye" measurements and keep content consumers happy. Download our application note for the details.
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MOST FREQUENTLY DOWNLOADED APPLICATION NOTES |
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Have an Account Manager Call Me!
Request a Call
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Download Your NEW 2010 Test and Measurement Product Catalog Today!
Download Now
Have an Account Manager Call Me!
Request a Call
Information Overload?
Customize this newsletter by changing your subscription Customize Now
Download Your NEW 2010 Test and Measurement Product Catalog Today!
Download Now
Have an Account Manager Call Me!
Request a Call
Information Overload?
Customize this newsletter by changing your subscription Customize Now
Download Your NEW 2010 Test and Measurement Product Catalog Today!
Download Now
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| Product News & Information |
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Tektronix Mixed Signal Scope Takes "Best in Test" Honors |
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| Test & Measurement World Magazine has named the Tektronix MSO70000 Series Mixed Signal Oscilloscope as the winner of their 2010 Best in Test award in the oscilloscope category. The awards honor products that have brought significant technological advancement to the test industry. Tektronix topped five other notable contenders, making this win especially meaningful. |
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Save up to 40% on Data and Pattern Generators |
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| Data and Pattern Generators are now available at up to a 40% savings through TekSelect. These instruments are ideal for evaluating logic circuits or creating complex timing control signals for test systems. |
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Visit the Scope Guru on EDN Guest Blog |
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| Check out the new EDN Magazine Guest Blog, "Scope Guru on Signal Integrity," which appears on EDN.com throughout April. Jit Lim, Senior Technologist for Tektronix, shares both technical insights and humorous anecdotes drawn from his 25 years spent working with designers at labs around the world. |
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Choosing a Scope Probe the Easy Way |
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| Tektronix offers over 100 different probes to match its industry-leading oscilloscopes and your application. With advantages like the TekVPI® probing interface, Tektronix oscilloscopes set the standard for ease of use in probing. Our online interactive Tektronix Probe Selector Tool helps you find the right probes for your oscilloscope and application in just seconds. Try it out now! |
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New Jitter Measurement Package for the DSA8200 Digital Serial Analyzer |
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| The 80SJARB jitter measurement application software for the DSA8200 Series addresses IEEE 802.3ba applications requiring the J2 and J9 jitter measurements. It also enables basic jitter measurements for NRZ data signals including PRBS31, random traffic, and scrambled data. |
| Oscilloscopes |
Spectrum Analyzers |
Signal Generators |
| Leading signal fidelity and powerful features, like DPX™ for visibility and Pinpoint® triggering for faster debugging, make Tektronix the leader in oscilloscopes across the industry. Review our extensive portfolio of market-leading 40 MHz to 80+ GHz oscilloscopes. |
Effectively characterize time-variant signals and solve unexpected problems with DPX™ Live RF spectrum display. Standard on all Real-Time Spectrum Analyzers ranging from handheld to high performance benchtop instruments. |
Signal generation is critical for design verification. Tektronix offers a broad portfolio of products, from the value-priced Function Generator to the high-powered Arbitrary Waveform Generator for complex signal, noise and impairment generation. |
| Logic Analyzers |
Probes/Accessories |
Service & Support |
| From the market leader in Logic Analysis, see the ultimate in tools for hardware and software debugging, including Tektronix' unique solution for debugging DDR3 memory traffic. |
Tektronix provides a broad portfolio of probes and accessories, all perfectly matched to our industry-leading oscilloscopes. With over 100 choices available, select the probe you need for your specific testing application with our Online Probe Selector tool. |
You can trust Tektronix to offer unequalled engineering expertise and a customer-centric approach to ensure the optimal performance of your Tektronix products and maximize the lifetime value of your Tektronix investment. |
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